In analyses of radiation scattering, accurately assessing the shape of the scatterer and the wavelength of the incident radiation is a goal that has challenged researchers since the beginning of optical science. This innovative text presents two methods of calculating the electromagnetic fields due to radiation scattering by a single scatterer. Both methods yield valid results for all wavelengths of the incident radiation as well as a wide variety of scatterer configurations.This innovative text presents two methods of calculating the electromagnetic fields due to radiation scattering by a single scatterer.

Title | : | Two Methods for the Exact Solution of Diffraction Problems |

Author | : | Frederick E. Alzofon |

Publisher | : | SPIE Press - 2004 |

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